| dc.description.abstract |
Vernalization sensitivity (V) and photoperiod sensitivity (P) were measured in a range of wheat cultivars by the hastening of development brought about by seed vernalization and long-day treatment, respectively. Using multiple linear regression analysis V and P accounted for 77-94 % of cultivar variation in the time from sowing to ear emergence, or to anthesis, over 19 sowings at three sites. From the regression equations, the optimum combination of P and V for adaptation to variable sowing time was estimated. In two cases this was predicted to be a wheat with high V and low P values. Seasonal changes in the coefficients of the multiple regression equations were related to environmental changes in temperatures and photoperiod. |
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